Investigation of gamma-ray attenuation characterization in high-purity silicon wafers using an MPPC-based detection system and LabVIEW-assisted theoretical modeling

Articles > Article · 2026

Authors: Gozde Tektas, Cüneyt ÇELİKTAŞ

Radiation Physics and Chemistry, International, WoS, 2026, vol 246, pp 113923-113923

DOI: 10.1016/j.radphyschem.2026.113923

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