A Comparative Study on Power MOSFET Reliability and Failure Modes
Conference paper > Full Text
Authors: Rahmet Aybuke Bilir, Nihan Altintas, Aydogan Bilir, Erkan MEŞE, Zulal Tosunoglu
2019 18th International Symposium INFOTEH-JAHORINA (INFOTEH), , , International, Full Text, pp 1-5
DOI: 10.1109/infoteh.2019.8717762
Summary
In this study, based on the characteristic parameters of MOSFET's degradation, reliability of MOSFETs from different companies has been compared. Same type of MOSFETs are investigated. Acceleration test are designed and devices are degraded. According to degradation data, transfer characterization is investigated and failure modes of MOSFETs have been examined. This degradation data of values have been observed %10 variance which is degradation's sign.