Dependence of Josephson Junction Critical Current on The Deposition Rate of YBa2Cu3O7−δ Thin Films
Bildiriler > Tam Metin Bildiri
Yazarlar: B. P. Algul, I. Avci, R. Akram, A. Bozbey, M. Tepe, D. Abukay
AIP Conference Proceedings, , , Uluslararası, Tam Metin Bildiri, Scopus, cilt 899, ss 762-762
DOI: 10.1063/1.2733503
Özet
We have reported the effect of YBa2Cu3O7−δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate.